Vol-1566
urn:nbn:de:0074-1566-8




ERMAVSS 2016
Early Reliability Modeling for Aging and Variability in Silicon Systems


Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems
co-located with IEEE/ACM Design, Automation and Test in Europe Conference (DATE 2016)

Dresden, Germany, March 18, 2016.


Edited by

Adrian Evans *
Stefano di Carlo **
Praveen Raghavan ***
Dimitris Gizopoulos ****

* IROC Technologies (Fance)
** Politecnico di Torino (Italy)
*** IMEC (Belgium)
**** University of Athens (Greece)




Table of Contents

Regular papers


2016-03-08: submitted by Stefano Di Carlo, metadata incl. bibliographic data published under Creative Commons CC0
2016-03-15: published on CEUR-WS.org |valid HTML5|